SM Metrology RT120 Laboratory Profilometer-roughness tester (0.25 - 0.5 - 1 mm/s)

Parameters calculated:  

ISO 21920-2: Ra; Rz; Rq; Rp; Rv; Rt; Rsk; Rku; Rsm; Rc; Rdq; Rda; Rpc; Rdc; Rmc; Rmc; Rcm; Rmr rel.; Wa; Wz; Wq; Wp; Wv; Wt; Wsk; Wku; Wsm; Wc; Wdq; Wpc; Wdc; Pa; Pq; Pp; Pv; Pt; Psk; Pku; Psm; Pc; Pdq; Ppc; Pdc; Rk; Rpk; Rvk; Rak1; Rak2; Rmrk1; Rmrk2

ISO 4287:09 - Rp, Rt, Rv, Rc, Rz, Rzjis, Ra, Ra75, RSm, RΔq, Rsk, Rku, Rδc, RPc, RmrRel Wp, Wt, Wv, Wc, Wz, Wa, Wq, WSm, WΔq, Wsk, Wku, Wδc, WPc, WmrRel Pp, Pt, Pv, Pc, Pz, Pa, Pq, PΔSm, Pq, Psk, Pku, Pδc, PPc, PmeRel

ISO 13565:96 - Rk, Rpk, Rvk, Mr1, Mr2, A1, A2

DIN 4768:90 - Ry5, Rmax, R3z, R3zMax, PtDIN

ISO12085:98 - Pt, R, AR, Rx, Wte, W, AW, Wx, Rke, Rpke, Rvke

VDA 2007 - WD, WDc, WDt, WDSm

Measurement range in X: 120 mm (4.72 in)

Measurement range in Z: 3 mm (0.12 in) o 5 mm (0.39 in) or 20 mm (0,78 in) with SB402measure head unit 

Resolution in X: 0.1 μm (0.02 μin)

Resolution in Z: 0.1 nm (0.004 μin)

Measurement speed: 0.25 – 0.5 – 1 mm/s (0.01 – 0.02 – 0.04 in/s)

Tip sizes: Diamond cone 60° angle 2 µm (78 µin) radius

Traverse length of column: Column with a positioning of 300 mm (11.8 in)

CNC cycles: CNC automatic measurement and Positioning cycles with self-comparison

Connection: USB interface towards Windows© PC

Software: Profile Studio

Languages: Italian, French, English, German, Spanish, Portuguese and Slovenian

Sizes: LxDxH1100 x 570 x 720 mm  (43.3 x 22.4 x 28.3 in)

Overall weight: 76.5 kg(186.6 lbs)

Datasheet