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LANGER EMV-Technik P1202 / P1301 L-ESD set ESD Langer Pulse H 0.2/2.5 E 0.2/5.5 ns Field Coupling

ModelP1202 / P1301 L-ESD set
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Scope of delivery

1x P1202 L-ESD, ESD Magnetic Field Source Langer Pulse 0.2/2.5 ns

1x P1301 L-ESD, ESD E-Field Source Langer Pulse 0.2/5.5 ns

1x BPS 203, Burst Power Station

1x BPS 203-Client, Control Software

1x BPM 02, dB/dt Field Meter

1x EPM 02, dE/dt Field Meter

2x SMA-SMB 1 m, SMA-SMB Measuring Cable

1x HV FI-FI 1 m, High-Voltage Cable, Fischer-Fischer

1x FBK 12P 1m, Control Cable

1x USB-AB, USB Cable Type A-B

1x D70 h03, Spacer Ring, 3 mm

1x D70 h10, Spacer Ring, 10 mm

1x FKE 30, Field Chamber Insert

1x NT Ex EU, Power Supply Unit

1x P1202 / P1301 acc, Accessories

1x P1202 / P1301 case, System Case

1x P1202 / P1301 m, P1202 / P1301 Set User Manual

Short description

The field sources, which are included in the probe set field coupling 200 ps Langer ESD, generate very fast electric and magnetic ESD pulse fields. With these fields, ICs are defined and reproducibly pulsed to determine their immunity against ESD fields.

The reason for this is the ESD immunity of PC boards and electrical devices. The immunity is tested (IEC 61000-4-2). During the tests, standard ESD pulse fields and very fast electric and magnetic fields (200 ps) are generated by coupled ESD interference into the PC boards. These fields affect the PC board surface and penetrate the IC casings. If fields penetrate the ICs, disturbance events will be generated. The IC interference via magnetic or electrical fields is a significant source of interference path in addition to conducted coupling of ESD interference above the ICs.

From the probe set, knowledge will be gained of the IC EMC behaviour and this can be streamlined into the development of the PC board.

Expensive redesigns are avoided and development costs are reduced.

Furthermore, the use of the test methods for the determination of IC EMC parameters enables the IC producer to develop ICs more efficiently.

The test set-up needs the ICE1 test system and external devices.

Datasheet


Manual

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