Kewell MX300D-1500-3000 IGBT Dynamic Test System (0-1500V)

Output:

Voltage range: 0-1500V

Voltage precision: 0.1%FS

Voltage resolution: 0.1V

Voltage measurement:

LeCroy oscilloscope (Resolution: 12 bit, 4-channel; Band width: 350MHz; Sampling rate: 2.5GS/s)

YOKOGAWA 701977 differential voltage probe (Band width: 50MHz; Peak voltage: 7000V

Rated current: 10~3000A

Current precision: ±10%rdg

Current resolution: 1A

Current measurement:

LeCroy oscilloscope (Resolution: 12 bit, 4-channel; Band width: 350MHz; Sampling rate: 2.5GS/s)

CWT MINI 30B Rogowski coils

Parameters:

Work mode: Laboratory mode/Production mode

Positive & negative gate voltages: 0.5~30V

Gate voltage precision: 2%FS

Gate voltage resolution: 0.1V

Inductor load: 20µH; 50µH; 100µH; 200µH; 500µH; 1000µH; 2000µH

Substrate temp. range: 25~200℃

Substrate temp. precision: 0.5%FS

Substrate temp. resolution: 0.1℃

Reserved Interface:

Fixture (adapter): Customize according to IGBT models.

External load: Can be connected to user-selected devices

Gate resistance: Can be connected to user-selected devices

Gate capacitance: Can be connected to user-selected devices

Gate clamp: Can be connected to user-selected devices

Collector clamp: Can be connected to user-selected devices

Protection:

Overcurrent: Overcurrent protection point is editable; Fast protection activation

Input: OVP/OCP/Over-load/Under-voltage/Phase loss etc.

Output: OVP/OTP/OCP etc.

Specifications:

Protection level: IP21 (indoor)

Dimensions: 805mm (D) × 1400mm (W) ×1915mm (H)

Ambient Temperature: 25℃±10℃

Datasheet