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Technical Data
Range of scanning (mm): Range of scanning (mm):0～1000
D-delay (ms): D-delay (ms):0～5000
MTLVEL(m/s): MTLVEL:1000～9999
Working mode: Single probe (receiving and sending), double probe (one for receiving and another for sending), transmission (transmission probe)
Frequency Range (MHz): 0.5~10
Gain adjustment (dB): 0～110
Reject: 0%～80% of screen height
Vertical linear error: Vertical linear error is not more than 3%
Horizontal linear error: Not more than 0.1% in the scanning range
Sensitivity Leavings: ≥50 dB
Dynamic range: ≥36dB
Alarm: Three modes, i.e. forbidden wave, loss wave and auto
A-Scan display area: Full screen or local; A-Scan display freezing and de-freezing A-Scan filling
Data save: 500 A-Scan images (including setting of instrument)
Standard communication interface with PC: USB
Measuring unit: mm/inch
Battery: Li battery 3.6V 3000mAh * 4
Power adaptor: 4.2V DC 220AC
Working temperature: -20℃～50℃
Working humidity: 20%～90%
Port type: LEMO
Overall dimension (mm): 162×105×42
Weight (kg): 0.68 (include Li-ion battery)
Standard delivery
Main unit: 1
4.2V power adaptor: 1
probe connecting cable: 1
Carrying case: 1
Instruction manual: 1
Straight probe: 1 (Dia 20mm, 2.5MHz)
Angle probe: 1 (13×13, 60°, 2.5MHz)
Performance Features
The dual CPUs work in coordination, high speed detecting and data processing；
Automatic calibration；
Easy tests of thickness and sound velocity of materials;
Freely set standards for various industries to meet different flaw detection
Automated display precise flaw location(Depth d,level p,distance s,amplitude,dB,diameter ф)；
Freely set standards for various industries to meet different flaw detection；
The echo suppression is adjustable from 0 to 90%, without affecting the dB gain and linearity；
DAG and AVG(DGS) curves are generated automatically;
Muti-functions for easy detection: peak memory, Display freeze, automatic gain & wave search；
Li -battery, continue working time up to 10 hours;
Storage: 500 sets of flaw detection process and data storage;
Provides high contrast viewing of the waveform from bright, direct sunlight to complete darkness and easy to read from all angles;
USB connects to computer,automatically generate flaw detection report;
